Mater.Phys.Mech.(MPM)
No 1, Vol. 41, 2019, pages 84-87

USE OF X-RAY ANALYSIS FOR CONDUCTING INPUT AND PROCESS
CONTROL OF ELECTRONICS MATERIALS

Aleksandra N. Matvienko, Sergey P. Teslenko, Svetlana V. Shtelmah

Abstract

The paper presents examples of using X-ray diffraction and X-ray phase analysis for monitoring and researching materials for electronic equipment.

Keywords: crystal lattice parameter, diffraction line, materials for electronic equipment, phase composition, technological control, X-ray phase analysis

full paper (pdf, 736 Kb)