Departamento de Fisica da Universidade do Minho Campus de Gualtar, 4710-057 Braga, Portugal
| The inspection and characterization of nanomaterials and structures should be performed extensively and whenever possible in a non-invasive way. In recent years, a major development of image acquisition and digitalization systems was achieved as well as in what concerns image analysis and processing methods and tools. Those techniques are now being frequently used in metrology and characterization laboratories including in the fields of nanomaterials and systems. On this communication we will review the most relevant image acquisition and processing systems and techniques exemplifying with results of the work being performed at the Microtopography Laboratory and in collaboration with the Functional Coatings Group of the University of Minho. |
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