| The results of study of the total, diffuse and specular reflectance of polyazomethine thin films deposited on various substrates are reported. The main optical parameters, i.e the energy loss function, absorption, and scatter refraction coefficient were determined, and the values of rms roughness were found using AFM, Talysurf profilometer and integrating sphere. It appears that the films studied are characterized by a small rms roughness (4 - 7 nm), and the main reason of light scattering in this material is the volume scattering by crystalline centers inside the films, being essentially amorphous. It has been also found that, apart from a strong absorption in the range 350 - 500 nm, a strong Rayleigh scattering occurs above 600 nm. |
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