Rev.Adv.Mater.Sci.(RAMS)
No 5, Vol. 10, 2005, pages 427-433

PROCESSING AND EVALUATION OF X-RAY LINE PROFILES MEASURED FROM NANOSTRUCTURED MATERIALS
PRODUCED BY SEVERE PLASTIC DEFORMATION

Michael Kerber, Erhard Schafler and Michael Zehetbauer

Abstract

he classification of the microstructure of nanostructured materials and its relation to macroscopic properties is essential for the development and application of nanomaterials. X-ray line profile analysis is a nondestructive method yielding a series of interesting microstructural parameters: The Bragg reflection of an ideal crystal is a narrow delta-function like peak. Distortions of the regular crystal lattice as well as a finite size of the coherently scattering domains (CSDs) lead to a significant broadening of the peak. By using physical models describing the individual types of broadening it is possible to relate the broadening of the peak to the microstructure of the material. From these models various techniques have been developed to evaluate the same physical quantities via individual methods. Usually the measured data can not be used for evaluation immediately and preprocessing is necessary. A number of typical problems arising during data preparation and evaluation are presented and a procedure to optimize the processing of the experimental data is given.

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