Rev.Adv.Mater.Sci. (RAMS)
No 8, Vol. 18, 2008, pages 703-710


Nataliya B. Dyakonova, Igor V. Lyasotsky and Galina I. Nosova


Nanocrystalline ω structures in quenched Ti1-xVx (x= 0.13 - 0.40) and Ti1-yFey (y=0.065 - 0.20) were studied by means of XRD and TEM methods. XRD data at 20 úC and - 195 úC were obtained for monocrystalline samples. Anomalous reversible increase of peak intensities of ω reflections at low temperature accompanied by decrease of their width was observed for alloys with valence electron concentrations 4.19-4.25 e/a. Correlation between temperature dependences of intensity of ω reflections and resistivity was observed for alloys in the quenched state and after low temperature annealing. The nature of nanoscale structures consisting of ω clusters of 4 different crystallographic orientations in BCC matrix is discussed in connection with electronic structure of the alloys.

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